- 使用性能出眾的微波網(wǎng)絡(luò)分析儀，應(yīng)對(duì)苛刻的測(cè)量挑戰(zhàn)
- 在測(cè)量 S 參數(shù)時(shí)實(shí)現(xiàn)超低的不確定度和超高穩(wěn)定度
- 利用應(yīng)用軟件簡(jiǎn)化設(shè)置，高效表征有源器件
- 通過(guò)定制化配置得到恰當(dāng)?shù)男阅?，滿(mǎn)足您的特殊預(yù)算和測(cè)量需求
- 多點(diǎn)觸控屏和直觀(guān)的用戶(hù)界面加速對(duì)元器件特性的分析
選件
| N5224B-200 | 2-port, base hardware configuration |
| N5224B-201 | 2-port with configurable test set, reference mixer switch |
| N5224B-205 | 2-port with configurable test set, ref mixer switch, bias tees, low frequency extension |
| N5224B-210 | 2-port with metrology configuration |
| N5224B-217 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators |
| N5224B-219 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
| N5224B-220 | 2-port with configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
| N5224B-400 | 4-port with second source |
| N5224B-401 | 4-port with second source, configurable test set, reference mixer switch |
| N5224B-405 | 4-port with second source, configurable test set, reference mixer switch, bias tees, low frequency extension |
| N5224B-410 | 4-port with second source, metrology configuration |
| N5224B-417 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators |
| N5224B-419 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees |
| N5224B-420 | 4-port with second source, configurable test set, reference mixer switch, source and receiver attenuators, bias tees, low frequency extension |
